EMIR

Siyacon Technologies delivers cutting-edge EMIR analysis and power integrity solutions for advanced-node semiconductor designs, ensuring robust reliability from 7nm down to 2nm technologies. Our proprietary thermal-electrical co-simulation platform combines machine learning-assisted hotspot prediction with 3DIC-aware current distribution modeling to proactively address electromigration and IR drop challenges. Specializing in mission-critical applications, we perform automotive-grade mission-profile reliability assessment, dynamic voltage stability analysis, and aging-aware power network optimization that exceeds AEC-Q100 standards.

Leveraging hybrid static/dynamic analysis methodologies, we enable first-time-right silicon through predictive power integrity verification, TSV current crowding mitigation, and adaptive voltage regulation strategies. For AI/ML accelerators, high-performance computing chips, and 3D-IC designs, our solution provides foundry-certified EMIR signoff with silicon-correlated accuracy, reducing design iterations while maximizing product lifespan. Partner with us for next-generation power delivery network analysis that addresses emerging challenges in FinFET, GAA, and beyond.