Standard Characterization

Siyacon Technologies delivers complete standard characterization solutions for semiconductor devices across all technology nodes, from mature processes to cutting-edge 3nm/2nm designs. Our comprehensive testing methodology validates critical device parameters through precise DC characterization (IV/CV curves, leakage current analysis, threshold voltage extraction), rigorous AC performance evaluation (propagation delay, setup/hold timing, dynamic power profiling), and exhaustive reliability testing (BTI, HCI, electromigration).

We employ foundry-certified measurement flows using high-precision equipment capable of < 1μV/1pA resolution to ensure silicon-accurate results.For production-ready validation, we perform full PVT corner analysis across temperature ranges (-40°C to 150°C) and supply voltages, complemented by Monte Carlo simulations to quantify process variations.