Memory Characterization

Siyacon Technologies delivers cutting-edge memory characterization solutions for next-generation semiconductor designs, specializing in performance optimization, power analysis, and reliability validation of SRAM, DRAM, and emerging non-volatile memory technologies. Our advanced testing methodology enables precise evaluation of access timing, read/write margins, and data retention across extreme temperature ranges (-40°C to 150°C) and voltage conditions. Utilizing automated probe systems and custom test architectures, we provide silicon-verified memory models with industry-leading correlation accuracy for 3nm/2nm nodes.

For AI/ML applications, we offer specialized characterization of in-memory compute architectures, including conductance profiling of RRAM arrays and neuromorphic synapse emulation. Automotive clients benefit from our AEC-Q100 qualified testing flow featuring accelerated aging studies and radiation-hardened memory validation.